Počet záznamov: 1
mikroskopia elektrónová skenovacia
SYS d008855 LBL 00000cx--j2200000---45-- 005 20240119201056.0 100 $a 19990101asloy0103----ba0 152 $b mesh 250 $a mikroskopia elektrónová skenovacia $x CL $x EC $x ES $x HI $x IS $x MT $x SN $x ST $x TD $x VE $8 slo 300 1-
$a 72(69) $8 eng 300 1-
$a Microscopy, Electron (1966-1968) $8 eng 330 1-
$a Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY. $8 eng 450 $a Scanning Electron Microscopy $5 e $8 eng 450 $a mikroskopia elektrónová snímacia $5 e $8 slo 450 $a mikroskopia elektrónová rastrovacia $5 e $8 slo 550 $3 sllk_un_auth*d016319 $Y Corrosion Casting $5 F $a naleptávanie 686 $a E01.370.350.515.402.541 686 $a E05.595.402.541 750 $a Microscopy, Electron, Scanning $8 eng 801 -0
$a US $b DNLM $c 19990101 801 -2
$a SK $b BA006 $c 20010711 801 -2
$a SK $b BA006 $c 20141114 820 $a do not confuse with MICROSCOPY, ELECTRON, SCANNING TRANSMISSION or STEM $8 eng 980 $x M
Počet záznamov: 1