Počet záznamov: 1
spektrometria hmotnostná, s použitím sekundárnych iónov
Heslo spektrometria hmotnostná, s použitím sekundárnych iónov Heslo anglicky Spectrometry, Mass, Secondary Ion Odkazy SIMS mikroskopia
mikroskopia spektrometrická, s použitím sekundárnych iónov
spektroskopia hmotnostná, s použitím sekundárnych iónovAngl. X odkazy Mass Spectrometry, Secondary Ion
Mass Spectroscopy, Secondary Ion
SIMS Microscopy
Secondary Ion Mass Spectrometry
Secondary Ion Mass Spectrometry Microscopy
Spectroscopy, Mass, Secondary IonVysvetľujúca pozn. v angl. A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra-high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio. Digital imaging can be generated from the secondary ion beams and their intensity can be measured. Ionic images can be correlated with images from light or other microscopy providing useful tools in the study of molecular and drug actions. 
predmetové heslo
Počet záznamov: 1