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mikroskopia elektrónová skenovacia
Č. záznamu d008855 Dátum 06.06.2025 Typ M - MESH Tematický termín mikroskopia elektrónová skenovacia Iný termín Angličtina (Pseudonym) Scanning Electron Microscopy
Slovenčina (Pseudonym) mikroskopia elektrónová snímacia
Slovenčina (Pseudonym) mikroskopia elektrónová rastrovacia
Pozri tiež (Skutočné meno) naleptávanie
MDT E01.370.350.515.402.541E05.595.402.541 Poznámka Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY. 
predmetové heslo
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