Počet záznamov: 1
mikroskopia elektrónová
SYS d008854 LBL 00000cz--a2200000o--4500 005 20250606214403.3 008 990101|||anznnbabn-----------|-a|a------ 040 $b slo $a DNLM $d BA006 065 $a E01.370.350.515.402 065 $a E05.595.402 066 $a 01 $c 03 150 $a mikroskopia elektrónová $x CL $x EC $x ES $x HI $x IS $x MT $x SN $x ST $x TD $x VE $2 slo 450 $w v $a Electron Microscopy $2 eng 680 9-
$i Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen. $2 eng 680 $a general or unspecified; prefer specifics $2 eng 750 -2
$a Microscopy, Electron $2 eng 980 $x M
Počet záznamov: 1