Microscopy, Electron, X-Ray Microanalysis Spectrometry, X-Ray Emission, Electron Microscopic Spectrometry, X-Ray Emission, Electron Probe X-Ray Emission Spectrometry, Electron Microscopic X-Ray Emission Spectrometry, Electron Probe X-Ray Microanalysis, Electron Microscopic X-Ray Microanalysis, Electron Probe
Scope note in English
Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.
See also reference (FX) in Slovak
mikroskopia nukleárna
See also reference (FX) in English
Nuclear Microscopy
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(3) - ARTICLES
(1) - MeSH descriptor
subject heading
openseadragon
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