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mikroskopia atómová silová

Subject h.	mikroskopia atómová silová
Subject h.	Microscopy, Atomic Force
Entry terms	mikroskopia atómových síl mikroskopia atomárnych síl mikroskopia silová skenovacia mikroskopia silová
English X references	Atomic Force Microscopy Force Microscopy Scanning Force Microscopy
Scope note in English	A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.
See also reference (FX) in Slovak	mikroskopia skenovacia tunelová
See also reference (FX) in English	Microscopy, Scanning Tunneling
Links	(4) - ARTICLES
	(1) - MeSH descriptor
	(1) - BOOKS

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