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mikroskopia elektrónová skenovacia

  1. Subject h.mikroskopia elektrónová skenovacia
    Subject h.Microscopy, Electron, Scanning
    Entry termsmikroskopia elektrónová snímacia
    mikroskopia elektrónová rastrovacia
    English X referencesScanning Electron Microscopy
    Scope note in EnglishMicroscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.
    See also reference (FX) in Slovak naleptávanie
    See also reference (FX) in English Corrosion Casting
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    (1) - MeSH descriptor
    (2) - CiBaMed
    (23) - BOOKS
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