A type of scanning probe microscopy in which a very sharp conducting needle is swept just a few angstroms above the surface of a sample. The tiny tunneling current that flows between the sample and the needle tip is measured, and from this are produced three-dimensional topographs. Due to the poor electron conductivity of most biological samples, thin metal coatings are deposited on the sample.
See also reference (FX) in Slovak
mikroskopia atómová silová
See also reference (FX) in English
Microscopy, Atomic Force
Links
(2) - ARTICLES
(1) - MeSH descriptor
subject heading
Number of the records: 1
openseadragon
This site uses cookies to make them easier to browse. Learn more about
how we use cookies.