Number of the records: 1
mikroskopia skenovacia sondová
Subject h. mikroskopia skenovacia sondová Subject h. Microscopy, Scanning Probe Entry terms mikroskopia snímacou sondou English X references Scanning Probe Microscopy Scope note in English Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING). 
subject heading
Number of the records: 1