Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.
Pozri aj (FX) v slov.
naleptávanie
Pozri aj (FX) v angl.
Corrosion Casting
Odkazy
(26) - ČLÁNKY
(1) - heslo MeSH
(2) - CiBaMed
(23) - KNIHY
predmetové heslo
openseadragon
Počet záznamov: 1
Tieto stránky využívajú súbory cookies, ktoré uľahčujú ich prezeranie. Ďalšie informácie o tom
ako používame cookies.
