Počet záznamov: 1
spektrometria röntgenová emisná
SYS d013052 LBL 00000cz--a2200000o--4500 005 20250606214629.2 008 920329|||anznnbabn-----------|-a|a------ 040 $b slo $a DNLM $d BA006 065 $a E05.196.867.800 065 $a E05.799.830 066 $a 01 $c 03 150 $a spektrometria röntgenová emisná $x CL $x EC $x ES $x HI $x IS $x MT $x SN $x ST $x TD $x VE $2 slo 450 $w v $a Particle-Induced X-Ray Emission Spectrometry $2 eng 450 $w v $a Proton-Induced X-Ray Emission Spectrometry $2 eng 450 $w v $a Spectrometry, Particle-Induced X-Ray Emission $2 eng 450 $w v $a Spectrometry, Proton-Induced X-Ray Emission $2 eng 450 $w v $a Spectrometry, X-Ray Fluorescence $2 eng 450 $w v $a X-Ray Emission Spectrometry $2 eng 450 $w v $a X-Ray Emission Spectroscopy $2 eng 450 $w v $a X-Ray Fluorescence Spectrometry $2 eng 450 $w v $a spektrometria röntgenová emisná, indukovaná časticami $2 slo 450 $w v $a spektrometria röntgenová emisná, indukovaná protónmi $2 slo 450 $w v $a spektrometria röntgenová fluorescenčná $2 slo 450 $w v $a spektroskopia röntgenová emisná $2 slo 665 $a 1978 $2 eng 665 $a Fluorescence (1966-1977) $2 eng 665 $a Spectrometry, Fluorescence (1972-1977) $2 eng 665 $a Spectrum Analysis (1966-1977) $2 eng 665 $a X-Rays (1975-1977) $2 eng 680 9-
$i The spectrometric analysis of fluorescent X-RAYS, i.e. X-rays emitted after bombarding matter with high energy particles such as PROTONS; ELECTRONS; or higher energy X-rays. Identification of ELEMENTS by this technique is based on the specific type of X-rays that are emitted which are characteristic of the specific elements in the material being analyzed. The characteristic X-rays are distinguished and/or quantified by either wavelength dispersive or energy dispersive methods. $2 eng 680 $a do not confuse with entry terms at ELECTRON PROBE MICROANALYSIS; do not confuse entry term SPECTROMETRY, X-RAY FLUORESCENCE with SPECTROMETRY, FLUORESCENCE $2 eng 750 -2
$a Spectrometry, X-Ray Emission $2 eng 980 $x M
Počet záznamov: 1