Počet záznamov: 1
mikroskopia skenovacia sondová
SYS d020527 LBL 00000nx--j22000003--45-- 005 20240119200319.6 100 $a 19991103csloy0103----ba0 152 $b mesh 250 $a mikroskopia skenovacia sondová $x CL $x EC $x ES $x HI $x IS $x MT $x SN $x ST $x TD $x VE $8 slo 300 1-
$a 2000; use MICROSCOPY, ATOMIC FORCE 1999 $8 eng 300 1-
$a Microscopy, Atomic Force (1999) $8 eng 330 1-
$a Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING). $8 eng 450 $a Scanning Probe Microscopy $5 e $8 eng 450 $a mikroskopia snímacou sondou $5 e $8 slo 686 $a E01.370.350.515.666 686 $a E05.595.666 750 $a Microscopy, Scanning Probe $8 eng 801 -0
$a US $b DNLM $c 19991103 801 -2
$a SK $b BA006 $c 20001123 801 -2
$a SK $b BA006 $c 20141113 980 $x M
Počet záznamov: 1